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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Apr 7, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

Microcantilever based distance control between a probe and a surface.

R Molenaar¹, J C Prangsma¹, K O van der Werf¹

¹Nanobiophysics Group, MESA+ Institute for Nanotechnology and MIRA Institute for Biomedical Technology and Technical Medicine, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands.

The Review of Scientific Instruments

|July 3, 2015

Summary

This summary is machine-generated.

We developed a new method for precise control of the distance between a probe and sample, achieving nanometer accuracy. This technique enhances atomic force microscopy (AFM) capabilities for nanoscale measurements.

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Last Updated: Apr 7, 2026

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Area of Science:

Atomic Force Microscopy (AFM)
Nanotechnology
Surface Science

Background:

Precise control of probe-sample distance is crucial for high-resolution surface analysis.
Existing methods face limitations in accuracy and stability at the nanoscale.

Purpose of the Study:

To demonstrate a novel method for controlling probe-sample distance from nanometer to micrometer scales.
To achieve high accuracy and stability in distance control using atomic force microscopy.

Main Methods:

Utilizing closed-loop feedback based on the angular deflection of an in-contact AFM microcantilever.
Minimizing internal error sources within the microcantilever and feedback loop.
Investigating and mitigating hysteresis effects caused by tip-substrate friction.

Main Results:

Achieved accurate and precise distance control up to 3 nm.
Demonstrated nanometer-scale absolute accuracy for probe-sample distances from contact to several micrometers.
Minimized hysteresis effects through a short calibration procedure.

Conclusions:

The presented method offers robust and accurate probe-sample distance control for AFM.
The technique is compatible with various probes and easily integrated into existing AFM systems.
This advancement enables improved nanoscale measurements and surface characterization.