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Standardless Quantification of Heavy Elements by Electron Probe Microanalysis.

Aurélien Moy1,2, Claude Merlet1, Olivier Dugne3

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This study measured X-ray intensities for Pt, Au, Pb, U, and Th, finding good agreement between experimental data and Monte Carlo simulations for accurate standardless quantification.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Atomic Physics

Background:

  • Accurate elemental quantification is crucial in various scientific fields.
  • Electron probe microanalysis (EPMA) relies on precise X-ray intensity measurements.
  • Standardless quantification methods require reliable theoretical models and experimental validation.

Purpose of the Study:

  • To measure absolute Mα and Mβ X-ray intensities for Pt, Au, Pb, U, and Th.
  • To validate Monte Carlo simulations against experimental X-ray data.
  • To develop and test a standardless quantification method using virtual standards.

Main Methods:

  • Electron impact excitation of bulk samples using an electron microprobe.
  • High-resolution wavelength-dispersive X-ray spectrometry.
  • Monte Carlo simulations for theoretical X-ray intensity calculations.
  • Detector efficiency evaluation for absolute X-ray yield determination.

Main Results:

  • Absolute Mα and Mβ X-ray intensities were accurately measured for Pt, Au, Pb, U, and Th.
  • Experimental X-ray intensities showed good agreement with Monte Carlo simulations.
  • A novel procedure and software were developed for virtual standard generation.
  • Standardless quantification of Pb and U was successfully tested on various standards.

Conclusions:

  • Monte Carlo simulations are reliable for predicting Mα and Mβ X-ray intensities.
  • The developed standardless quantification method offers accurate elemental analysis.
  • This approach enhances the capabilities of electron probe microanalysis for elemental determination.