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Simultaneous Affinity Enrichment of Two Post-Translational Modifications for Quantification and Site Localization
Published on: February 27, 2020
Quantitative surface scanning by Direct Analysis in Real Time mass spectrometry
Tim T Häbe1, Gertrud E Morlock1
1Interdisciplinary Research Center (IFZ) and Institute of Nutritional Science, Chair of Food Science, Justus Liebig University Giessen, Heinrich-Buff-Ring 26-32, 35392, Giessen, Germany.
This study modified the Direct Analysis in Real Time mass spectrometry (DART-MS) interface for improved quantitative surface scanning. The new DART-MS system enhances precision and detectability for analyzing surfaces like HPTLC plates.
Area of Science:
- Analytical Chemistry
- Mass Spectrometry
- Chromatography
Background:
- Quantitative surface scanning using ambient ionization is challenging.
- Direct Analysis in Real Time mass spectrometry (DART-MS) requires interface modifications for precise HPTLC plate analysis.
- Improved quantitation without internal standards is needed.
Purpose of the Study:
- To enhance the precision of DART-MS for quantitative surface scanning.
- To optimize the DART-MS interface for analyzing planar substrates like HPTLC plates.
- To improve analyte desorption, ionization, and capture for better quantitation.
Main Methods:
- Optimized substrate movement relative to the ion source and mass spectrometer inlet.
- Mounted the substrate carrier at an angled position to reduce gas stream collisions.
- Utilized a specialized angled transfer tube to capture the deflected DART gas stream.
Main Results:
- Achieved a mean precision of 2.7% for repeated DART-MS scanning of deposited bands.
- Observed a signal decay of 62% after five scans.
- Obtained high determination coefficients (0.9937 and 0.9906) for HPTLC calibrations, with 94% mean recovery and 9% repeatability.
Conclusions:
- The modified DART-MS system (SVPA-3DS) is compact with wide substrate access.
- Quantitative surface scanning performance, desorption efficacy, and detectability were significantly improved.
- The optimized interface facilitates precise analysis of surfaces without internal standard correction.
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