Three-dimensional mapping of optical near field with scattering SNOM

Scattering-type scanning near-field optical microscopy (s-SNOM) is applied to investigate three-dimensional optical near field distribution, including both amplitude and phase information. A method analogous to the force volume mode of the atomic force microscopy (AFM) technique is adapted for the measurement. The results show high lateral resolution of tens of nanometers, and even higher vertical resolution of only a few nanometers. The experiment results provide a straightforward illustration of the optical near fields in the space above the sample surface. Numerical computations support the experimental data. The ability to map the 3D optical near filed helps to reveal the factors that influence the performance of the designed near-field structures.