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Transparent material thickness measurements by Raman scattering.

Sergey M Pershin, Vasily N Lednev, Renat N Yulmetov

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    |July 21, 2015
    PubMed
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    This study introduces a Raman spectroscopy technique for measuring transparent sample thickness. It effectively detects interfaces, offering a promising remote, noninvasive method for field experiments.

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    Area of Science:

    • Materials Science
    • Spectroscopy
    • Analytical Chemistry

    Background:

    • Accurate thickness measurement of transparent materials is crucial in various scientific and industrial applications.
    • Traditional methods can be invasive or limited in scope, especially for layered or submerged samples.
    • Elastic scattering is useful for detecting interfaces with significant refractive index changes but fails for some critical boundaries like ice-water.

    Purpose of the Study:

    • To develop an efficient, simple, and convenient technique for transparent sample thickness measurements using Raman spectroscopy.
    • To overcome the limitations of elastic scattering for specific interfaces, such as floating ice.
    • To establish a remote and noninvasive method for in-situ thickness determination.

    Main Methods:

    • Utilized Raman spectroscopy to detect interfaces between transparent materials by analyzing spectral differences.
    • Applied Raman spectroscopy to identify the poly methyl methacrylate (PMMA)-water and ice-water interfaces.
    • Employed elastic scattering for air-solid surface detection, complementing Raman spectroscopy.

    Main Results:

    • Raman spectroscopy successfully located PMMA-water and ice-water interfaces.
    • Elastic scattering effectively indicated sample borders with >3% refractive index change.
    • The combined approach achieved thickness measurement errors between 2%-5%.

    Conclusions:

    • Raman spectroscopy is a viable and accurate method for detecting interfaces in transparent materials.
    • This technique offers a promising solution for remote and noninvasive thickness measurements in field settings.
    • The method demonstrates potential for applications where precise layer determination is required without sample disruption.