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Updated: Apr 6, 2026

Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects
Published on: January 4, 2016
Mauro Satta1, Stefano Colonna2, Roberto Flammini2
1CNR-Istituto per lo Studio dei Materiali Nanostrutturati, Dipartimento di Chimica, Università di Roma "La Sapienza", P.le Aldo Moro 5, I-00185, Roma, Italy.
The study reveals silicon atoms exchange with silver atoms in the Ag(111) surface, challenging the immiscibility assumption for silicene growth. This interaction is crucial for understanding the Si/Ag(111) interface.
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Published on: February 11, 2020
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