Nano-level position resolution for particle tracking in digital in-line holographic microscopy

H Lei1, X Hu1, P Zhu2

  • 1State Key Laboratory of Precision Measuring Technology & Instruments, Tianjin University, Tianjin, 300072, China.

Journal of Microscopy
|August 5, 2015
PubMed
Summary

This study introduces an adaptive noise reduction method for digital in-line holographic microscopy, improving 3D particle tracking resolution in biological applications. The technique achieves nanometer-level precision for tracking biological samples.