Carrier Generation and Recombination
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
Imperfections in Crystal Structure: Point, Line and Plane Defects
Nucleotide Excision Repair
Nucleotide Excision Repair
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Apr 5, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Yinan Shu1, B Scott Fales1, Benjamin G Levine1
1Department of Chemistry, Michigan State University , East Lansing, Michigan 48824, United States.
Conical intersections in oxidized silicon nanocrystals facilitate nonradiative recombination, a process accelerated in smaller particles. This study introduces a new method for identifying defects causing this recombination.
06:57Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
07:50Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: