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Electric field stimulation setup for photoemission electron microscopes.

M Buzzi1, C A F Vaz1, J Raabe1

  • 1Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.

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Summary
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Investigating magnetoelectric coupling in multiferroics is crucial for low-power electronics. This study introduces a new X-ray photoemission electron microscopy setup for in situ electric and magnetic field analysis of these materials.

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Area of Science:

  • Condensed Matter Physics
  • Materials Science
  • Nanotechnology

Background:

  • Magnetoelectric multiferroics offer potential for low-power electronic devices.
  • Understanding magnetoelectric coupling is key to harnessing multiferroic properties.
  • X-ray photoemission electron microscopy (XPEEM) provides high spatial resolution for surface analysis.

Purpose of the Study:

  • To develop and demonstrate an in situ experimental setup for investigating magnetoelectric coupling in multiferroic nanostructures.
  • To enable simultaneous application of electric and magnetic fields during XPEEM analysis.
  • To showcase the capabilities of the setup using artificial multiferroic heterostructures.

Main Methods:

  • Utilized X-ray photoemission electron microscopy (XPEEM) for high-resolution imaging.
  • Developed a specialized stage for applying in situ electric and magnetic fields within the microscope.
  • Analyzed artificial multiferroic nanostructures, including Ni/PMN-PT and LSMO/PMN-PT.

Main Results:

  • Successfully implemented a novel XPEEM setup capable of in situ electric and magnetic field application.
  • Demonstrated the capability to investigate magnetoelectric coupling in artificial multiferroic nanostructures.
  • Obtained high-resolution microscopy data under applied fields, showcasing the setup's performance.

Conclusions:

  • The developed in situ XPEEM setup is a powerful tool for studying magnetoelectric coupling in multiferroics.
  • This technique facilitates the exploration of novel physics and device applications in multiferroic materials.
  • The presented measurements validate the effectiveness of the experimental approach for advanced materials characterization.