Ellipse fitting for interferometry. Part 3: dynamic method.

Area of Science:

• * Physics and Astronomy
• * Data Analysis and Signal Processing

Background:

• * Conventional static ellipse fitting methods, originally designed for image processing, face limitations with noisy data in interferometric applications.
• * Interferometric measurements often generate time-series data where each point possesses a phase parameter.

Purpose of the Study:

• * To introduce and validate a novel dynamically based method for fitting ellipses to noisy data.
• * To demonstrate the advantages of this dynamic method over traditional static approaches in interferometric contexts.

Main Methods:

• * Utilizes the inherent time-series nature of interferometric data, assigning a phase parameter to each data point.
• * Employs a dynamic fitting approach that accounts for the ordered sequence of data points.

Main Results:

• * The dynamic method achieves significantly greater accuracy with real experimental data compared to static methods.
• * Achieves high precision, limited only by the statistical reliability of the data itself.
• * Successfully fits ellipses even when the minor axis is smaller than the measurement noise.

Conclusions:

• * The proposed dynamic ellipse fitting method offers a more accurate and precise solution for noisy interferometric data.
• * This technique overcomes limitations of static methods, particularly in challenging scenarios with low signal-to-noise ratios or small elliptic features.