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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Expansion of the difference-field boundary element method for numerical analyses of various local defects in periodic

Jun-ichiro Sugisaka, Takashi Yasui, Koichi Hirayama

    Journal of the Optical Society of America. A, Optics, Image Science, and Vision
    |September 15, 2015
    PubMed

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