Optical sharper focusing in an anisotropic crystal

Optical super-resolution technique through tight focusing is a widely used technique to image material samples with anisotropic optical properties. The knowledge of the field distribution of a tightly focused beam in anisotropic media is both scientifically interesting and technologically important. In this paper, the optical properties of a uniaxial crystal with the optic axis perpendicular to the interface under a tight focusing configuration are studied with rigorous theoretical and numerical analysis. The significant effect of the Poynting vector on the focal position introduces an obvious displacement of the focal spot formed by the extraordinary waves (e-ray). Moreover, a sharper focus with a lateral size of 0.22λ is obtained as a result of the effective separation of the ordinary waves (o-ray) and the e-ray. It provides a new tool to fabricate optical structures with higher resolutions than that in an isotropic medium through the far-field method.