Related Experiment Video
Updated: Apr 3, 2026

Scanning Electron Microscopic Evaluation of Surface Defects of Remover Retreatment File After Single and Multiple Uses
Published on: October 11, 2024
Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning
Yeo Hun Yoon1, Seung Jae Kim2, Dong Hwan Kim3
1ADD, Daejeon, Korea.
Abstract:
The scanning electron microscope is used in various fields to go beyond diffraction limits of the optical microscope. However, the electron pathway should be conducted in a vacuum so as not to scatter electrons. The pretreatment of the sample is needed for use in the vacuum. To directly observe large and fully hydrophilic samples without pretreatment, the atmospheric scanning electron microscope (ASEM) is needed. We developed an electron filter unit and an electron detector unit for implementation of the ASEM. The key of the electron filter unit is that electrons are transmitted while air molecules remain untransmitted through the unit. The electron detector unit collected the backscattered electrons. We conducted experiments using the selected materials with Havar foil, carbon film and SiN film.
Related Concept Videos
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Overview of Electron Microscopy
Mass Analyzers: Overview
Preparation of Samples for Electron Microscopy
Super-resolution Fluorescence Microscopy
Transmission Electron Microscopy

