Indirect selection for resistance to ear rot and leaf diseases in maize lines using biplots

Leaf disease and ear rot have caused reductions in maize yield in Brazil and other producer countries. Therefore, the aims of this study were to analyze the association between husked ear yield and the severity of maize white spot, gray leaf spot, helminthosporium, and ear rot caused by Fusarium verticillioides and Diplodia maydis using biplots in a mixed-model approach. The responses of 238 lines introduced to Brazil and four controls were evaluated using an incomplete block design with three replicates in two locations: Lavras and Uberlândia, Minas Gerais, Brazil. Two experiments were conducted in each location, one with F. verticillioides and the other with D. maydis. The mixed models elucidated the relationship between yield, leaf disease, and ear disease. Significant genotype x environment and genotype x pathogen interactions were observed. In conclusion, husked ear yield is more associated with ear rot than with the leaf diseases evaluated, justifying the indirect selection for resistance to kernel rot in maize-F. verticillioides and maize-D. maydis pathosystems by yield evaluation.