Related Experiment Video
Updated: Apr 3, 2026

10:39
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
10.2K
Temperature-fluctuation-sensitive accumulative effect of the phase measurement errors in low-coherence interferometry
Applied Optics
|September 26, 2015
Summary
Environmental temperature fluctuations cause accumulative phase measurement errors in low-coherence interferometry. Increasing scanning speed effectively minimizes these errors, ensuring accurate characterization of optical multipath components.
Area of Science:
- Optical Engineering
- Metrology
- Interferometry
Background:
- Low-coherence interferometry is crucial for characterizing optical multipath components.
- Environmental temperature fluctuations can introduce phase measurement errors due to refractive index variations.
- These errors can accumulate, impacting the accuracy of optical component characterization.
Purpose of the Study:
- To investigate the accumulative effect of phase measurement errors in low-coherence interferometry.
- To understand the influence of environmental temperature fluctuations on these errors.
- To identify methods for mitigating the accumulative phase measurement errors.
Main Methods:
- Utilized low-coherence interferometry to measure optical multipath components.
- Experimentally induced and monitored phase measurement errors under varying environmental conditions.
- Varied scanning speed during measurements to assess its impact on error accumulation.
Main Results:
- Demonstrated that phase measurement errors accumulate with increasing phase difference between interferometer arms.
- Confirmed that the accumulative effect is significant even with small thermo-optical coefficients.
- Observed a substantial decrease in the slope of phase measurement errors with increased scanning speed (up to 4.8 mm/s).
Conclusions:
- Environmental temperature fluctuations are a primary cause of accumulative phase measurement errors.
- Increasing the scanning speed of the interferometer is an effective method to suppress these errors.
- At a scanning speed of 4.8 mm/s, the accumulative effect becomes negligible, enabling accurate characterization.

