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Related Experiment Video

Updated: Feb 26, 2026

A Multimodal Wide-Field Fourier-Transform Raman Microscope

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

Mode-resolved frequency comb interferometry for high-accuracy long distance measurement.

Steven A van den Berg¹, Sjoerd van Eldik², Nandini Bhattacharya²

¹VSL, Thijsseweg 11, 2629 JA Delft, The Netherlands.

Scientific Reports

|October 1, 2015

Summary

This study demonstrates precise long-distance measurement using a single femtosecond frequency comb laser. This advanced optical frequency comb technology achieves high accuracy for metrology applications.

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Area of Science:

Optics and Photonics
Metrology
Laser Physics

Background:

Optical frequency combs are advanced tools for precise distance measurements.
Previous methods often require complex setups or have limitations in range and accuracy.

Purpose of the Study:

To demonstrate absolute long-distance measurement using a single femtosecond frequency comb laser.
To achieve high-resolution spectral analysis of frequency comb modes for interferometry.

Main Methods:

Utilizing a single femtosecond frequency comb laser as a multi-wavelength source.
Employing a high-resolution spectrometer with a virtually imaged phased array to resolve individual comb modes.
Stabilizing the frequency comb against an atomic clock for accurate wavelength generation.
Integrating spectral interferometry, white light interferometry, and multi-wavelength interferometry into a single measurement scheme.

Main Results:

Thousands of accurately known wavelengths were generated for interferometry.
Absolute distance was derived from the spectrally resolved output of a Michelson interferometer.
The measurement method achieved an agreement within <10(-8) for a 50-meter distance when compared to a fringe counting laser interferometer.

Conclusions:

A single femtosecond frequency comb laser enables accurate absolute long-distance metrology.
The combined interferometric techniques offer a robust and precise measurement solution.
This method significantly advances the capabilities of optical metrology for long distances.