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Light propagation and interaction observed with electrons.

Robert C Word1, J P S Fitzgerald1, R Könenkamp1

  • 1Physics Department Portland State University, 1719 SW 10th Avenue, Portland, OR 97201, USA.

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Summary
This summary is machine-generated.

Photoemission electron microscopy enables microscopic optical characterization of thin films and surfaces. This technique visualizes light and evaluates material properties non-invasively with nanometer resolution.

Keywords:
Multi-photon excitationNon-linear imagingPhotoemission electron microscopyPulsed laser excitation

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Area of Science:

  • Materials Science
  • Optics
  • Surface Science

Background:

  • Microscopic optical characterization is crucial for understanding thin films and surfaces.
  • Existing methods may lack the required spatial or temporal resolution.
  • Photoemission electron microscopy (PEEM) offers potential for advanced surface analysis.

Purpose of the Study:

  • To explore the capabilities of photoemission electron microscopy for microscopic optical characterization.
  • To demonstrate the visualization of light propagation in the visible range.
  • To evaluate linear and non-linear material properties non-invasively at the nanoscale.

Main Methods:

  • Utilizing photoemission electron microscopy (PEEM).
  • Employing an interferometric approach for imaging.
  • Achieving femtosecond temporal resolution in pump-probe experiments.

Main Results:

  • Successful visualization of propagating light across the visible spectrum.
  • Non-invasive evaluation of linear and non-linear material properties.
  • Demonstration of nanometer spatial resolution in optical characterization.
  • Image frame times of approximately 200 femtoseconds (fs) achieved with the interferometric method.

Conclusions:

  • Photoemission electron microscopy is a powerful tool for microscopic optical characterization.
  • The technique provides high spatial resolution for analyzing thin films and surfaces.
  • It enables non-invasive evaluation of optical material properties with excellent temporal precision.