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X-ray Crystallography02:18

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Development of an ellipse fitting method with which to analyse selected area electron diffraction patterns.

D R G Mitchell1, J A Van den Berg2

  • 1Electron Microscopy Centre, Australian Institute for Innovative Materials, Innovation Campus, University of Wollongong, North Wollongong, NSW 2500, Australia.

Ultramicroscopy
|October 27, 2015
PubMed
Summary
This summary is machine-generated.

A new software method uses ellipse fitting to precisely analyze electron diffraction patterns from polycrystalline materials. This technique rapidly provides accurate crystallographic data and corrects imaging system distortions for enhanced precision.

Keywords:
DistortionElectron diffractionEllipse fittingsoftware analysis

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Area of Science:

  • Materials Science
  • Crystallography
  • Electron Diffraction Analysis

Background:

  • Electron diffraction is crucial for analyzing polycrystalline materials.
  • Accurate crystallographic information requires precise analysis of diffraction patterns.
  • Existing methods may lack precision or struggle with imaging system distortions.

Purpose of the Study:

  • To develop a software method for accurate electron diffraction pattern analysis.
  • To enable rapid and consistent determination of crystallographic information.
  • To detect, quantify, and correct elliptical distortions in diffraction patterns.

Main Methods:

  • Developed a software method utilizing ellipse fitting for pattern analysis.
  • The method determines pattern center and ring diameters with sub-pixel precision.
  • Implemented as a freely available plugin for DigitalMicrograph software.

Main Results:

  • Achieved sub-pixel precision in determining pattern center and diffraction ring diameters.
  • Successfully detected, quantified, and corrected elliptical distortions.
  • Demonstrated improved precision and accuracy when applying distortion correction to single crystal patterns.

Conclusions:

  • The ellipse fitting software method offers a rapid, consistent, and precise approach to analyzing electron diffraction patterns.
  • Correction of elliptical distortions significantly enhances the accuracy of crystallographic data.
  • The freely available plugin facilitates wider adoption and improved materials analysis.