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Optical fiber tip templating using direct focused ion beam milling.

A Micco¹, A Ricciardi¹, M Pisco¹

¹Optoelectronic Division, Department of Engineering, University of Sannio, I-82100, Benevento, Italy.

Scientific Reports

|November 5, 2015

Summary

Researchers developed a novel method to integrate sub-wavelength resonant structures onto optical fiber tips using focused ion beam milling. This technique enables flexible fabrication of advanced photonic and plasmonic devices for Lab-on-Fiber Technology.

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Area of Science:

Photonics
Nanotechnology
Materials Science

Background:

Optical fiber sensors offer miniaturization potential.
Integrating complex nanostructures onto fiber tips is challenging.
Sub-wavelength resonant structures can enhance optical functionalities.

Purpose of the Study:

To present a direct fabrication method for sub-wavelength resonant structures on optical fiber tips.
To demonstrate the versatility of the fabricated structures for photonic and plasmonic applications.
To advance Lab-on-Fiber Technology through novel integration techniques.

Main Methods:

Direct milling of glass on fiber facets using a focused ion beam (FIB).
Patterned fiber tips used as templates for material deposition.
Fabrication and characterization of double-layer photonic crystal slabs and hybrid photonic-plasmonic structures.

Main Results:

Successful integration of sub-wavelength resonant structures on optical fiber tips.
Demonstration of guided resonances in double-layer photonic crystal slabs.
Creation of hybrid photonic-plasmonic structures with tunable spectral responses.

Conclusions:

The FIB milling technique provides a flexible platform for fabricating advanced optical devices on fiber tips.
Understanding and mitigating fabrication-induced effects are crucial for device optimization.
This work significantly contributes to the development of Lab-on-Fiber Technology.