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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Graphene field effect transistors with niobium contacts and asymmetric transfer characteristics

Antonio Di Bartolomeo1, Filippo Giubileo, Francesco Romeo

  • 1Dipartimento di Fisica 'E.R. Caianiello' and Centro Interdipartimentale NanoMates, Università degli Studi di Salerno, Fisciano, Salerno, Italy. CNR-SPIN, Fisciano, Salerno, Italy.

Nanotechnology
|November 5, 2015
PubMed

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