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Updated: Mar 30, 2026
10:39
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
10.2K
Interferogram conditioning for improved Fourier analysis and application to X-ray phase imaging by grating
Optics Express
|November 13, 2015
Summary
A new iterative method conditions interferograms, reducing edge artifacts in phase retrieval. This fast Fourier demodulation technique enhances X-ray interferometry results.
Area of Science:
- Physics
- Optics
- Image Processing
Background:
- Fourier transform techniques in interferometry often suffer from edge artifacts due to discontinuities in fringe patterns.
- Classical phase retrieval methods struggle with boundary conditions, limiting accuracy in analyzing interference fringe patterns.
Purpose of the Study:
- To present a fast, iterative interferogram conditioning procedure for accurate phase retrieval.
- To demonstrate the correction of edge artifacts in Fourier analysis of interference fringe patterns.
- To enhance grating-based interferometric measurements in the hard X-ray regime.
Main Methods:
- Developed a fast iterative conditioning procedure for interferograms.
- Simulated interference fringe patterns with edge discontinuities to test the method.
- Optimized algorithm parameters for the conditioning procedure.
- Applied the procedure to hard X-ray grating interferometry data.
Main Results:
- The conditioning procedure effectively corrects edge artifacts common in traditional Fourier analysis.
- Nearly edge-artifact-free retrieval of phase derivatives was achieved.
- Significant enhancement in the quality of retrieved absorption and fringe visibility images was observed.
Conclusions:
- The proposed iterative conditioning method significantly improves phase retrieval accuracy in interferometry.
- This technique is particularly effective for hard X-ray grating-based measurements.
- The algorithm offers a robust solution for mitigating edge artifacts in Fourier analysis of fringe patterns.
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