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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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Updated: Mar 30, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
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A Unique Self-Sensing, Self-Actuating AFM Probe at Higher Eigenmodes.

Zhichao Wu1, Tong Guo2, Ran Tao3

  • 1State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China. bertwu@tju.edu.cn.

Sensors (Basel, Switzerland)
|November 19, 2015
PubMed
Summary
This summary is machine-generated.

The Akiyama probe, a tuning fork atomic force microscope probe, demonstrates 2 nm resolution and high sensitivity at its second eigenmode. This enables versatile use in non-contact or tapping modes for soft sample analysis.

Keywords:
AFMfinite element analysishigher eigenmodenon-contactquartz tuning fork

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Physics

Background:

  • The Akiyama probe is a unique tuning fork atomic force microscope (AFM) probe.
  • Its long, soft cantilever is designed for measuring soft samples using tapping mode.

Purpose of the Study:

  • To characterize the Akiyama probe's performance at its second eigenmode.
  • To evaluate its suitability for different AFM operational modes.

Main Methods:

  • Finite Element Analysis (FEA) was employed to model probe behavior.
  • Experimental measurements were conducted in a standard atmosphere.

Main Results:

  • The Akiyama probe exhibited a resolution of 2 nm.
  • A sensitivity of 0.09 Hz/nm was achieved at the second eigenmode.
  • Performance was evaluated despite suboptimal signal-to-noise ratio in ambient conditions.

Conclusions:

  • The Akiyama probe is suitable for its second eigenmode operation.
  • It can be utilized in Frequency Modulation (FM) non-contact mode or low amplitude FM tapping mode.
  • This allows for flexible switching between measurement techniques with the same equipment.