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Nanocrystal size distribution analysis from transmission electron microscopy images
Martijn van Sebille1, Laurens J P van der Maaten, Ling Xie
1Photovoltaic Materials and Devices, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands. m.vansebille@tudelft.nl.
Nanoscale
|November 24, 2015
Summary
We developed a fast, low-bias method using image analysis to measure nanocrystal size distribution from transmission electron microscopy (TEM) images. This technique accurately quantifies silicon nanocrystal sizes and corrects for sample preparation artifacts.
Area of Science:
- Materials Science
- Nanotechnology
- Image Analysis
Background:
- Accurate characterization of nanocrystal size distribution is crucial for understanding material properties.
- Traditional methods for analyzing transmission electron microscopy (TEM) images can be time-consuming and prone to user bias.
Purpose of the Study:
- To develop and validate a rapid, automated method for quantifying nanocrystal size distribution from TEM images.
- To minimize user input bias in the analysis of nanocrystal size.
- To address and correct for errors introduced during sample preparation.
Main Methods:
- Utilized a combination of Laplacian of Gaussian filters and non-maximum suppression for nanocrystal detection.
- Applied the method to bright-field TEM images of silicon nanocrystals in an a-SiC:H sample.
- Compared the proposed method's accuracy and speed against manual measurements, thresholding, and PEBBLES.
Main Results:
- The proposed method demonstrated high accuracy and speed in determining nanocrystal size distribution.
- Achieved minimal bias compared to manual measurement and other automated techniques.
- Developed an analytical equation to correct for size distribution errors caused by sample slicing.
Conclusions:
- The developed image analysis technique offers a robust and efficient solution for nanocrystal size characterization.
- The method provides reliable measurements with reduced bias, suitable for various TEM imaging conditions.
- The introduced correction for slicing artifacts enhances the precision of size distribution analysis.
