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Effects of instrument imperfections on quantitative scanning transmission electron microscopy

Florian F Krause1, Marco Schowalter1, Tim Grieb1

  • 1Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany.

Ultramicroscopy
|December 22, 2015
PubMed

Keywords:
ADF STEMAccidental electronsArtifactsDetectorDiffraction distortionQuantitative STEMTEM

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