Related Experiment Video

Updated: May 10, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

The Cramér-Rao lower bound for the precision of scan position refinement in momentum-resolved STEM

Andreas Jehle1, Tizian Lorenzen1, Max Leo Leidl1

  • 1Department of Chemistry and Center for NanoScience, Ludwig-Maximilians-Universität München, Butenandtstr. 11, 81377 München, Germany.

Ultramicroscopy
|May 8, 2026
PubMed
Abstract

Keywords:
4D STEMFisher informationPhase retrievalPrecision estimationPtychography

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