Rigorous modelling of light scattering in solar cells based on finite element method and Huygens' expansion

Finite element method is coupled with Huygens' expansion to determine light intensity distribution of scattered light in solar cells and other optoelectronic devices. The rigorous foundation of the modelling enables calculation of the light intensity distribution at a chosen distance and surface of observation in chosen material in reflection or in transmission for given wavelength of the incident light. The calculation of scattering or anti-reflection properties is not limited to a single textured interface, but can be done above more complex structures with several scattering interfaces or even with particles involved. Both scattering at periodic and at random textures can be efficiently handled with the modelling approach. A procedure for minimisation of the effect of small-area sample, which is considered in the finite element method calculation, is proposed and implemented into the modelling. Angular distribution function, total transmission and total reflection of the scattering interface or structure can be determined using the model. Furthermore, a method for calculation of the haze parameter of reflected or transmitted light is proposed. The modelling approach is applied to periodic and random nano-textured samples for photovoltaic applications, showing good agreement with measured data.