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Radial lens distortion correction with sub-pixel accuracy for X-ray micro-tomography
Optics Express
|December 25, 2015
Summary
This study presents fast and accurate direct techniques for calculating camera distortion parameters. These methods enable rapid recalibration of imaging systems, crucial for configurable systems needing frequent maintenance.
Area of Science:
- Optical Engineering
- Image Processing
- Scientific Instrumentation
Background:
- Configurable imaging systems, especially those requiring frequent disassembly, necessitate efficient recalibration methods.
- Existing camera calibration techniques can be time-consuming, posing challenges for systems with high uptime requirements.
Purpose of the Study:
- To develop and present direct, rapid techniques for calculating non-linear distortion parameters.
- To establish accurate sub-pixel level calibration methods for imaging systems.
Main Methods:
- Direct calculation of distortion parameters based on precise determination of the center of distortion.
- Implementation and testing on an X-ray tomography system at Diamond Light Source (I12 beamline).
Main Results:
- The proposed techniques are fast, easy to implement, and achieve sub-pixel accuracy.
- Excellent performance was demonstrated in both calibration images and reconstructed images from the X-ray tomography system.
Conclusions:
- The direct distortion parameter calculation offers a speedy and accurate solution for recalibrating complex imaging systems.
- The method is highly suitable for applications demanding sub-pixel accuracy, such as X-ray tomography.
