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Understanding Capacitance Variation in Sub-nanometer Pores by in Situ Tuning of Interlayer Constrictions

Dona T L Galhena1, Bernhard C Bayer1,2, Stephan Hofmann1

  • 1Electrical Engineering Division, Department of Engineering, University of Cambridge , 9 J. J. Thomson Avenue, CB3 0FA Cambridge, U.K.

ACS Nano
|December 30, 2015
PubMed

Keywords:
electrical double-layer capacitorsgraphene oxidein situ X-ray diffractometryinterlayer constrictionssubnanometer poressupercapacitors

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