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Updated: Mar 27, 2026

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on: May 24, 2020
Seung-Won Yeom1, Sang-Chul Shin, Tan-Young Kim
1Display and Nanosystem Laboratory, College of Engineering, Korea University, Anam-dong, Seoul 139-713, Korea.
Flexible and transparent resistive switching memory (ReRAM) devices using aluminum oxide (Al2O3) and indium-zinc-oxide (IZO) electrodes were successfully fabricated. These devices maintain memory performance even when bent, paving the way for novel electronic applications.
10:40A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
09:49In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
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