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Excluding Contact Electrification in Surface Potential Measurement Using Kelvin Probe Force Microscopy.

Shengming Li1,2, Yusheng Zhou1, Yunlong Zi1

  • 1School of Materials Science and Engineering, Georgia Institute of Technology , Atlanta, Georgia 30332-0245, United States.

ACS Nano
|January 30, 2016
PubMed
Summary

Contact electrification during Kelvin probe force microscopy (KPFM) scanning can cause significant errors in surface potential measurements. This study identifies the cause and provides guidelines to prevent this artifact for accurate nanoscale electrical characterization.

Keywords:
contact electrificationdual-pass KPFMphase shift changesurface potential measurementtip−sample interactive force

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Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Kelvin probe force microscopy (KPFM) is crucial for nanoscale surface potential imaging of various materials.
  • Accurate KPFM measurements require understanding and mitigating potential artifacts.
  • Dual-pass KPFM, commonly used for topography and surface potential, involves a tapping mode scan.

Purpose of the Study:

  • To investigate the impact of the tapping-mode scan in dual-pass KPFM on measurement accuracy.
  • To identify the phenomenon causing artifacts in KPFM surface potential measurements.
  • To propose methods for decoupling artifacts from genuine surface potential data.

Main Methods:

  • Utilized dual-pass Kelvin probe force microscopy (KPFM) with a focus on the tapping-mode topography scan.
  • Analyzed the phase shift of the probe vibration to detect contact electrification.
  • Systematically varied scanning parameters, sample properties, and probe attributes.

Main Results:

  • The tapping-mode topography scan in KPFM can induce contact electrification, leading to a charged sample surface and erroneous potential readings.
  • Contact electrification is triggered when the probe enters the repulsive force regime of tip-sample interaction.
  • Lower free cantilever amplitude, higher adhesion, and lower cantilever spring constant reduce the likelihood of contact electrification.

Conclusions:

  • Contact electrification during KPFM's tapping scan is a significant source of error for surface potential measurements.
  • Guidelines for mitigating this artifact include decreasing free amplitude, increasing set-point amplitude, and using lower spring constant probes.
  • Implementing these strategies ensures more reliable nanoscale electrical property characterization.