Related Experiment Video
Updated: Mar 26, 2026

06:49
In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
Published on: March 2, 2021
6.8K
A semi-numerical model for near-critical angle scattering
Larissa Ju Fradkin1, Michel Darmon2, Sylvain Chatillon2
1Sound Mathematics Ltd., Cambridge CB4 2AS, United Kingdom.
The Journal of the Acoustical Society of America
|February 1, 2016
Summary
This study introduces a fast numerical method for evaluating complex integrals common in physics and mathematics. The new scheme accurately describes wave scattering phenomena, including non-classical diffraction effects.
Area of Science:
- Physics
- Mathematics
- Wave Scattering
- Numerical Analysis
Background:
- Many physical and mathematical phenomena involve integrals with oscillating integrands and multiple critical points.
- Evaluating these complex integrals, especially those with coalescing criticalities, poses a significant computational challenge.
Purpose of the Study:
- To develop a fast and efficient numerical scheme for evaluating integrals with oscillating integrands featuring coalescing criticalities.
- To apply and validate the proposed scheme in the context of wave scattering problems.
Main Methods:
- A novel numerical scheme based on the regularized composite Simpson's rule is proposed.
- The method is demonstrated by analyzing the scattering of an elastic plane wave by a stress-free half-plane crack.
Main Results:
- The proposed scheme efficiently evaluates challenging integrals with branch points, stationary phase points, and poles.
- It accurately describes non-classical diffraction effects near critical rays, including far-field spikes and near-field interference ripples.
Conclusions:
- The developed numerical scheme provides an effective solution for evaluating complex oscillatory integrals.
- This advancement aids in understanding intricate wave phenomena and diffraction effects in various scientific fields.
Related Concept Videos
Scanning Electron Microscopy
5.9K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Fundamental Principles
Accelerated...
5.9K
Mechanistic Models: Compartment Models in Algorithms for Numerical Problem Solving
394
Mechanistic models play a crucial role in algorithms for numerical problem-solving, particularly in nonlinear mixed effects modeling (NMEM). These models aim to minimize specific objective functions by evaluating various parameter estimates, leading to the development of systematic algorithms. In some cases, linearization techniques approximate the model using linear equations.
In individual population analyses, different algorithms are employed, such as Cauchy's method, which uses a...
In individual population analyses, different algorithms are employed, such as Cauchy's method, which uses a...
394

