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Updated: Mar 26, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
This study introduces a proximity-effect-correction (PEC) algorithm to improve 3D gray-scale photolithography accuracy. The optimized algorithm ensures fabricated 3D patterns closely match designed ones, enhancing resolution and pattern fidelity.
09:45Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies
Published on: June 12, 2018
07:47Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography
Published on: February 12, 2017
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