Spectral characterization of nanostructured birefringent porous silicon

We present measurements and analysis of the reflection spectrum of white light from a highly birefringent porous silicon layer at different polarization states. We report an anomalous pattern in the spectrum of linearly polarized light at 45° with respect to the principal axes of the layer. This spectrum comprises a combination of two interference effects, namely the Fabry-Perot-type multiple-beam interference present in a simple thin film, and a two-wave interference caused by the beat of two combined orthogonally polarized waves propagating in the birefringent medium. We perform a Fourier analysis of the measured reflected spectra. This analysis furnishes a powerful tool in order to separate the two interference mechanisms and determine the degree of coherence of their superposition.