Imperfections in Crystal Structure: Non-Stoichiometric Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
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Updated: Mar 26, 2026

Soft Lithographic Functionalization and Patterning Oxide-free Silicon and Germanium
Published on: December 16, 2011
Saidur Rahman Bakaul1, Claudy Rayan Serrao1,2, Michelle Lee3
1Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California, USA.
Researchers developed a new method to integrate single-crystal complex oxide films onto silicon. This breakthrough enables novel electronic applications by overcoming previous material incompatibilities.
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