Optical-Fiber Power Meter Comparison between NIST and KRISS
I Vayshenker1, S K Kim2, K Hong2
1National Institute of Standards and Technology, Boulder, CO 80305, USA.
Summary
A comparison of optical fiber power measurement standards between NIST-USA and KRISS-R.O. Korea found results within 2.5 parts in 10^3. This demonstrates excellent agreement between the national metrology institutes.", Enhanced_Abstract=default_api.SeocontentEnhancedAbstract(Area_of_Science=[
Area of Science:
- Metrology and Measurement Science
- Optical Engineering
- National Metrology Institutes
Background:
- Accurate optical power measurement is critical for telecommunications and photonics.
- International comparisons ensure consistency of measurement standards.
- National Institute of Standards and Technology (NIST-USA) and Korea Research Institute of Standards and Science (KRISS-R.O. Korea) are leading metrology institutes.
Purpose of the Study:
- To compare the national optical fiber power measurement reference standards of NIST-USA and KRISS-R.O. Korea.
- To assess the agreement between the two institutes' standards at specific wavelengths.
- To validate the accuracy and comparability of optical power measurements internationally.
Main Methods:
- Utilized a temperature-controlled optical trap detector for precise measurements.
- Conducted intercomparison of reference standards at 1302 nm and 1546 nm wavelengths.
- Analyzed measurement results to determine the difference between the laboratories' standards.
Main Results:
- The largest difference observed between NIST-USA and KRISS-R.O. Korea reference standards was less than 2.5 parts in 10^3.
- This difference was within the combined standard uncertainty (k=1) of the measurements.
- Demonstrated high agreement between the two national metrology institutes' standards.
Conclusions:
- The reference standards for optical fiber power measurements at NIST-USA and KRISS-R.O. Korea are in excellent agreement.
- The intercomparison validates the reliability of optical power measurements conducted by both institutes.
- This supports global consistency in optical metrology.


