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Updated: Mar 25, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Registration of Feature-Poor 3D Measurements from Fringe Projection
Sebastian von Enzberg1, Ayoub Al-Hamadi2, Ahmed Ghoneim3
1Institute for Information Technology and Communications (IIKT), Otto-von-Guericke University, PO Box 4120, 39016 Magdeburg, Germany. sebastian.vonenzberg@ovgu.de.
Abstract:
We propose a novel method for registration of partly overlapping three-dimensional surface measurements for stereo-based optical sensors using fringe projection. Based on two-dimensional texture matching, it allows global registration of surfaces with poor and ambiguous three-dimensional features, which are common to surface inspection applications. No prior information about relative sensor position is necessary, which makes our approach suitable for semi-automatic and manual measurement. The algorithm is robust and works with challenging measurements, including uneven illumination, surfaces with specular reflection as well as sparsely textured surfaces. We show that precisions of 1 mm and below can be achieved along the surfaces, which is necessary for further local 3D registration.
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