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Updated: Mar 24, 2026

Workflow and Tools for Crystallographic Fragment Screening at the Helmholtz-Zentrum Berlin

Workflow and Tools for Crystallographic Fragment Screening at the Helmholtz-Zentrum Berlin

Published on: March 3, 2021

Multilayer based soft-x-ray polarimeter at MAX IV Laboratory.

Walan Grizolli¹, Joakim Laksman¹, Franz Hennies¹

¹MAX IV Laboratory, P.O. Box 118, SE-22100 Lund, Sweden.

The Review of Scientific Instruments

|March 3, 2016

Summary

A new five-axis polarimeter was developed for extreme ultraviolet (EUV) measurements. This instrument utilizes advanced multilayer optics for high-precision polarization analysis across various beamlines.

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Area of Science:

Optics and photonics
Materials science
Instrumentation

Background:

Polarimetry is crucial for characterizing polarized light.
Existing instruments may lack precision or versatility in the extreme ultraviolet (EUV) spectrum.
Multilayer optics offer tunable reflective and transmissive properties.

Purpose of the Study:

To design and manufacture a high-precision five-rotation-axes polarimeter.
To enable polarization measurements in the extreme ultraviolet (EUV) regime.
To create a versatile instrument adaptable to different synchrotron beamlines.

Main Methods:

Designed and manufactured a five-rotation-axes polarimeter.
Utilized transmission multilayers (Mo/Si, Cr/C, Sc/Cr, W/B4C) as polarizers.

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Workflow and Tools for Crystallographic Fragment Screening at the Helmholtz-Zentrum Berlin

Workflow and Tools for Crystallographic Fragment Screening at the Helmholtz-Zentrum Berlin

Published on: March 3, 2021

Employed reflection multilayers as analyzers.

Integrated the instrument mechanics on a hexapod for simplified beamline alignment.

Main Results:

Successfully designed and manufactured a high-precision five-rotation-axes polarimeter.
Developed and produced specialized Mo/Si, Cr/C, Sc/Cr, and W/B4C multilayers for EUV applications.
The hexapod mount facilitates easy alignment and transfer between beamlines.

Conclusions:

The developed polarimeter offers high precision for EUV polarization measurements.
The use of advanced multilayer optics enables broad spectral coverage.
The instrument's design ensures versatility and ease of use in various experimental setups.