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High density plasmas and new diagnostics: An overview (invited)
L Celona1, S Gammino1, D Mascali1
1Istituto Nazionale di Fisica Nucleare-Laboratori Nazionali del Sud, Via S. Sofia 62, 95123 Catania, Italy.
The Review of Scientific Instruments
|March 3, 2016
Summary
Advanced diagnostics are crucial for understanding Electron Cyclotron Resonance Ion Sources (ECRISs). New X-ray and optical spectroscopy tools enhance ECRIS performance and design for optimized ion beams.
Area of Science:
- Plasma Physics
- Accelerator Technology
- Atomic and Molecular Physics
Background:
- Electron Cyclotron Resonance Ion Sources (ECRISs) are vital for producing ion beams.
- Limited diagnostic tools hinder a full understanding of ECRIS fundamental mechanisms.
- Optimizing ECRIS performance requires advanced diagnostics across the electromagnetic spectrum.
Purpose of the Study:
- To present the INFN-LNS strategy for developing advanced diagnostics for ECRIS.
- To support the design and optimization of new and existing ion sources.
- To enable microwave-absorption oriented design for future ECRIS machines.
Main Methods:
- Development of volume-integrated X-ray spectroscopy (2-30 keV with Silicon Drift Detectors, >30 keV with High Purity Germanium Detectors).
- Implementation of high-resolution, spatially resolved X-ray spectroscopy using quasi-optical methods (pin-hole cameras).
- Utilization of optical emission spectroscopy for controlling cold electron displacement and optimizing ion confinement.
Main Results:
- New diagnostic tools have been developed at INFN-LNS.
- These tools span microwave interferometry to X-ray and optical spectroscopy.
- Spatially resolved X-ray spectroscopy and advanced X-ray detectors are now available.
Conclusions:
- Advanced diagnostics are essential for ECRIS fundamental understanding and optimization.
- The developed tools facilitate improved microwave-to-plasma coupling and magnetostatic field tailoring.
- This strategy supports the development of more efficient ECRIS for future applications.
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