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Updated: Mar 24, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Bo Zhao1, Peihong Cheng2, Haiyang Pan1
1National Laboratory of Solid State Microstructures, Collaborative Innovation Center of Advanced Microstructures, and College of Physics, Nanjing University, Nanjing, 210093, P.R. China.
This study investigates Cd3As2 films, revealing weak antilocalization phenomena explained by the Hikami-Larkin-Nagaoka (HLN) theory. Electron-electron interactions are identified as the primary cause of dephasing in this Dirac material.
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