Nanoscale characterization of vesicle adhesion by normalized total internal reflection fluorescence microscopy

Marcelina Cardoso Dos Santos1, Cyrille Vézy1, Rodolphe Jaffiol1

  • 1Laboratoire de Nanotechnologie et d'Instrumentation Optique, Institut Charles Delaunay, UMR CNRS 6281, Université de Technologie de Troyes, 12 Rue Marie Curie, CS 42060, 10 004 Troyes Cedex, France.

Summary

We developed a simple fluorescence microscopy method to measure vesicle adhesion. This technique quantifies membrane-surface interactions from weak to strong, aiding in understanding vesicle behavior.