2D-Omnidirectional Hard-X-Ray Scattering Sensitivity in a Single Shot.

Matias Kagias1,2, Zhentian Wang1,2, Pablo Villanueva-Perez1,2

  • 1Swiss Light Source, Paul Scherrer Institute, 5232 Villigen, Switzerland.

Summary

This study introduces a novel X-ray scattering imaging technique for comprehensive microstructure analysis. It enables simultaneous acquisition of scattering data in all directions in a single shot, enhancing imaging capabilities.

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