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Information transfer of 25.5 nm-1 in a 1-MV field-emission transmission electron microscope

Tetsuya Akashi1, Yoshio Takahashi2, Toshio Onai2

  • 1Research and Development Group, Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan tetsuya.akashi.sq@hitachi.com.

Microscopy (Oxford, England)
|March 26, 2016
PubMed

Keywords:
chromatic aberrationfield-emission TEMinformation limitinformation transferlattice fringemechanical stability

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