Long-term follow-up after PFO device closure: Outcomes and Complications in a Single-center Experience

Nathaniel W Taggart1, Guy S Reeder2, Ryan J Lennon3

  • 1Division of Pediatric Cardiology, Mayo Clinic, Rochester, Minnesota.

Insights

Device closure of patent foramen ovale (PFO) is safe for preventing stroke and TIA. Long-term follow-up shows good shunt resolution, with recurrent events linked to other health conditions, not residual shunting.

Area of Science:

  • Cardiology
  • Neurology
  • Medical Devices

Background:

  • Patent foramen ovale (PFO) closure is used for secondary stroke prevention.
  • Long-term outcome data for PFO device closure are limited.

Purpose of the Study:

  • To evaluate medium- to long-term outcomes of PFO device closure.
  • To identify risk factors for recurrent stroke or transient ischemic attack (TIA) after PFO closure.

Main Methods:

  • Retrospective review of 730 patients undergoing PFO device closure (2001-2012).
  • Analysis of demographic, clinical, procedural, and follow-up data.
  • Calculation of recurrent stroke/TIA rates and identification of associated risk factors.

Main Results:

  • Median follow-up was 6 years; 6.3% experienced recurrent stroke/TIA.
  • Older age, diabetes, and hypertension were associated with recurrent events.
  • Residual shunting did not correlate with recurrent neurologic events.

Conclusions:

  • PFO device closure is safe and effectively resolves atrial shunting long-term.
  • Recurrent events are likely due to comorbid factors rather than residual shunt.
  • Further research into managing comorbidities post-PFO closure is warranted.
Abstract

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