YSZ thin films with minimized grain boundary resistivity

Edmund M Mills1, Matthias Kleine-Boymann, Juergen Janek

  • 1University of California Davis, Department of Chemical Engineering and Materials Science, 3001 Ghausi Hall, Davis California 95616, USA. chmkim@ucdavis.edu.

Summary

Thin films of yttria-stabilized zirconia (YSZ) electrolytes show enhanced ionic conductivity when made thinner than 8 nm. This improvement is due to reduced grain boundary resistivity achieved by Mg(2+) diffusion from the substrate.

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