High-Field EPR/ENDOR of N/Be Centers for Defect Engineering in 6H-SiC

Yuliya Ermakova1, Ekaterina Dmitrieva1, Margarita Sadovnikova1

  • 1Institute of Physics, Kazan Federal University, Kremlyovskaya 18, Kazan 420008, Russia.

Summary

This study explores dual-impurity doping in silicon carbide (SiC) for quantum technology applications. Researchers used advanced electron paramagnetic resonance (EPR) and electron-nuclear double resonance (ENDOR) to characterize nitrogen and beryllium defects, revealing insights into their spin properties.

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