Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Lateral force microscopy calibration using an interferometric atomic force microscope.

The Review of scientific instruments·2026

Same author

Median method for robust and accurate power spectral density estimation of stochastic oscillators.

The Review of scientific instruments·2025

Same author

Static and dynamic calibration of torsional spring constants of cantilevers.

The Review of scientific instruments·2018

Same author

Fast, High Resolution, and Wide Modulus Range Nanomechanical Mapping with Bimodal Tapping Mode.

ACS nano·2017

Same author

Generalized Hertz model for bimodal nanomechanical mapping.

Beilstein journal of nanotechnology·2016

Same author

Calibration of higher eigenmodes of cantilevers.

The Review of scientific instruments·2016

Same journal

Compressed multi-scale entropy and its application in mechanical fault diagnosis.

The Review of scientific instruments·2026

Same journal

Bidirectional drive and multi-resolution adjustment across frequency bands in inertial impact piezoelectric motors via multimodal resonant vibration.

The Review of scientific instruments·2026

Same journal

A magnetic field sensor based on flaky Terfenol-D material and dual fiber grating.

The Review of scientific instruments·2026

Same journal

A novel E-field eight-way cavity combiner for high-power S-band applications.

The Review of scientific instruments·2026

Same journal

Constant radius blade spring suspended bench for vibration isolation.

The Review of scientific instruments·2026

Same journal

Qualification of infrared optical fibers and emitters for a spectrometer for in situ planetary exploration: Results from the TRIS (TRansmission and Illumination System) project.

The Review of scientific instruments·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Mar 23, 2026

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

Published on: February 28, 2019

Daniell method for power spectral density estimation in atomic force microscopy.

Aleksander Labuda¹

¹Asylum Research an Oxford Instruments Company, Santa Barbara, California 93117, USA.

The Review of Scientific Instruments

|April 3, 2016

Summary

This summary is machine-generated.

The Daniell method offers a more accurate power spectral density estimation for atomic force microscopy than the Bartlett method. It reduces spectral leakage, improving the identification of cantilever thermal motion and simple harmonic oscillator parameters.

More Related Videos

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Related Experiment Videos

Last Updated: Mar 23, 2026

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

Published on: February 28, 2019

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Area of Science:

Atomic Force Microscopy
Spectroscopy
Physical Chemistry

Background:

Cantilever thermal motion analysis is crucial in Atomic Force Microscopy (AFM).
Power spectral density (PSD) estimation is commonly used for this analysis.
The Bartlett method is the prevalent PSD estimation technique in AFM.

Purpose of the Study:

To compare the Daniell method with the Bartlett method for PSD estimation in AFM.
To evaluate their accuracy in quantifying cantilever thermal motion.
To assess their susceptibility to spectral leakage and deterministic noise.

Main Methods:

Revisiting the Daniell method for PSD estimation.
Comparing the Daniell and Bartlett methods using a simple harmonic oscillator (SHO) model.
Analyzing the impact of spectral leakage and deterministic noise on PSD estimation.

Main Results:

Both Daniell and Bartlett methods underestimate the Q factor of an SHO, but this is correctable.
The Bartlett method exhibits significant spectral leakage, obscuring thermal spectra with deterministic noise.
The Daniell method demonstrates reduced spectral leakage, enabling clearer identification of noise peaks.

Conclusions:

The Daniell method provides a more accurate PSD estimation than the Bartlett method in AFM.
Reduced spectral leakage in the Daniell method facilitates robust identification and rejection of noise.
The Daniell method is valuable for developing automated algorithms for accurate SHO parameter estimation from thermal spectra.