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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Feb 22, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Fast, High Resolution, and Wide Modulus Range Nanomechanical Mapping with Bimodal Tapping Mode.

Marta Kocun¹, Aleksander Labuda¹, Waiman Meinhold¹

¹Asylum Research-An Oxford Instruments Company , Santa Barbara, California 93117, United States.

|September 28, 2017

Summary

This summary is machine-generated.

Bimodal tapping atomic force microscopy (AFM) enables quantitative nanomechanical property mapping. This advanced technique, AM-FM imaging, accurately measures stiffness and elastic modulus for diverse materials and molecules.

Keywords:

atomic force microscopy bimodal AFM modulus mapping nanomechanical properties tapping mode

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Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a widely used imaging technique.
Quantifying tip-sample mechanical properties like stiffness using traditional tapping mode AFM has been challenging.
Bimodal tapping mode enhances AFM by utilizing an additional cantilever resonance.

Purpose of the Study:

To introduce and discuss the advantages of bimodal tapping mode AFM, termed AM-FM imaging, for quantitative nanomechanical characterization.
To demonstrate the capability of AM-FM imaging for mapping elastic modulus across a broad range of material stiffness.
To showcase high-resolution stiffness mapping of individual molecules and biological samples.

Main Methods:

Employing bimodal tapping mode AFM, which drives and measures a second cantilever resonance alongside the primary tapping mode.
Utilizing frequency modulated (FM) driving of the higher cantilever resonance to directly measure tip-sample interaction stiffness.
Applying appropriate models to extract set point-independent local elastic modulus from the measured observables.

Main Results:

AM-FM imaging successfully mapped elastic modulus for materials ranging from soft gels (∼100 MPa) to stiff materials (∼100 GPa) using a single cantilever type.
High-resolution (subnanometer) stiffness mapping was achieved for individual molecules in semicrystalline polymers and for DNA in fluid.
Quantitative measurements were maintained at high line scan rates of nearly 40 Hz.

Conclusions:

AM-FM imaging offers a versatile and quantitative approach for nanomechanical characterization.
The technique overcomes limitations of traditional tapping mode AFM for precise stiffness and modulus determination.
AM-FM imaging is suitable for a wide array of applications, including polymer science, molecular imaging, and biological studies.