Reducing Sweeping Frequencies in Microwave NDT Employing Machine Learning Feature Selection

Abdelniser Moomen1, Abdulbaset Ali2, Omar M Ramahi3

  • 1Department of Computer Science, Rochester Institute of Technology, 1 Lomb Memorial Drive, Rochester, NY 14623, USA. axmvcs@rit.edu.

Summary

This study introduces a machine learning approach to reduce the number of frequencies needed for microwave nondestructive testing (NDT). This intelligent method enhances structural health monitoring efficiency for metallic and dielectric materials.

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