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Updated: Feb 14, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Ali M Almuhlafi1, Omar M Ramahi2
1Department of Electrical Engineering, College of Engineering, King Saud University, Riyadh 12372, Saudi Arabia.
A novel three-dimensional near-field scanning microwave microscopy (NSMM) probe with enhanced electric-field localization improves imaging resolution. This 3D split-ring resonator (SRR) probe overcomes diffraction limits for detailed electromagnetic property analysis.
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