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Measurement of the optical path length difference in an interferometer using a sinusoidally frequency-modulated light
Applied Optics
|May 4, 2016
Summary
We developed a new interferometer technique using a frequency-modulated light source to precisely measure optical path length difference (OPLD). This method is fast, accurate, cost-effective, and works even for long OPLDs.
Area of Science:
- Optical Physics
- Metrology
- Interferometry
Background:
- Accurate measurement of optical path length difference (OPLD) is crucial in various scientific and industrial applications.
- Conventional interferometric methods face limitations in sampling rate, precision, and determining the longer optical path.
Purpose of the Study:
- To develop a novel, high-performance technique for measuring OPLD in interferometers.
- To overcome the limitations of existing OPLD measurement methods.
Main Methods:
- Utilized a frequency-modulated light source within an interferometer setup.
- Developed a technique to analyze the interference signal for OPLD determination.
Main Results:
- Achieved high sampling rate and high precision in OPLD measurements.
- Successfully determined which of the two optical paths was longer.
- Demonstrated the technique's robustness even when OPLD exceeds the light source's coherence length.
Conclusions:
- The developed frequency-modulated light source technique offers a superior alternative for OPLD measurement.
- This method provides enhanced accuracy, speed, and cost-efficiency for interferometric applications.
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